Method of Dry Electron-Beam Lithography

Type
Изобретение
ID
RU2629135
Author(s)
G.A. Zharik, S.A. Dagesian, E.S. Soldatov, I.V. Bozhiev, D.E. Presnov, V.A. Krupenin, O.V. Snigirev
Abstract
Layer of resist is applied, which is chosen as a low-molecular-weight polystyrene, onto the substrate by the method of thermal vacuum deposition,whilethetemperatureofthesubstrateduring the deposition is not more than 30°C; a latent image is formed on the substrate by local exposure of a high-energy electron beam with a light dose of 2000-20000 mcC/cm²; a resist is developed, when the substrate is heated in a vacuum to the temperature of 600-800 K and at the pressure of not more than 10⁻¹ mbar and plasma etching to transfer the pattern of the resist mask to the substrate to form the micro- and nanostructure on the substrate.
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